| 5.2.1.1 - Testing for Immunity to 18V Transient, (2010-01) |
| 5.2.1.3.1 - Slow Decreasing and Increasing of Operating Voltage (2010-01) |
| 5.2.1.3.1 - Slow Decreasing and Increasing of Operating Voltage, alternate (2010-01) |
| 5.2.1.3.2 - Slow Decreasing and Fast Rise of Operating Voltage (2010-01) |
| 5.2.1.3.3 - IGR Development of Voltage, (2010-01) |
| 5.2.1.5 - Cranking Profile, Level I (2010-01) |
| 5.2.1.5 - Cranking Profile, Level II (2010-01) |
| 5.2.1.5 - Cranking Profile, Level III (2010-01) |
| 5.2.1.5 - Cranking Profile, Level IIp (2010-01) |
| 5.2.1.5 - Cranking Profile, Level Ip (2010-01) |
| 5.2.1.6 - Very Brief Voltage Dip, (2010-01) |
| 5.2.1.7 - Brief Voltage Dip, (2010-01) |
| 5.3.2 - Load Dump Impulses 5A severity Level 3 (2010-01) |
| 5.3.2 - Load Dump Impulses 5A severity Level 4 (2010-01) |
| 5.3.2 - Load Dump Impulses 5B severity Level 3 (2010-01) |
| 5.3.2 - Load Dump Impulses 5B severity Level 4 (2010-01) |
| 5.3.3.1 - Protection against Polarity Reversal (2010-01) |
| 5.3.3.2 - Protection against Polarity Reversal for Semiconductor Power Circuit (2010-01) |
| 5.3.4 - Interruption (2010-01) |
| 5.3.5.1 - Testing of Inputs and Outputs without Load Circuits (2010-01) |