3110A Standards Waveform Generator: 3000+ Automotive & Industry Standards' Tests Included
The 3110A is a simple-to-use yet powerful standards waveform generator. It can be combined with other AE Techron products to quickly create a wide range of powerful and intelligent EMC test solutions.
The 3110A outputs a standard analog signal that can work with any AE Techron amplifier or other LF amplifiers that you already have. When coupled with the AE Techron model 7234 amplifier,
the 3110A can create virtually all waveforms, DC offsets, dropouts and surges needed for EMC tests with rise/fall times of 2µs or greater and frequencies from DC to 1 MHz.
The 3110A software is built around the simple concept of a waveform segment. Each waveform segment can have a unique waveform, (sine, square, triangle, and/or DC offset). Frequency, amplitude and DC offset can be clipped, fixed, variable or swept. Segments can be calibrated (as required in CS101) and set to continue on to the next segment or to hold for an external trigger.
The power of the system occurs when waveform segments are linked to create test sequences. These test sequences can be of any length and can be run as a single sequence, looped, or looped with multiple variables changing within the test sequence (as required in multiple Toyota and GM standards). Finally, multiple sequences can be combined to create a single customized extended test.
An extensive library of 3000+ tests for many automotive, aviation and industry Standards makes it possible for the 3110A to save time from day one. And, for customers that require over-testing or testing for products that have no predefined standard, tests from the Standards Library can be easily modified and saved for later use
The 3110A delivers extensive capabilities for LF EMC testing with very short training-time requirements. Plus, it makes it easy to automate repetitive and labor-intensive tasks, making the 3110A a very efficient and cost-effective solution for LF EMC testing.
3110A
Up to 1 MHz EMC Testing
- Easiest-to-use LF wave sequence generator
- 3000+ automotive and aviation standards' tests included
- Dramatically reduces test time for repetitive test sequences
- Semi-automatic calibration routine significantly reduces labor-intensive tasks (like CS101)
- Very easy to modify included waveform sequences or create new ones
Key Performance Capabilities:
- Bandwidth - DC to 1 MHz
- Rise Time - Under 2µs
- Minimum Pulse Duration - Under 15µs for burst; 30µs for continuous
Specifications
Technical Details - Hardware
Output Channels: 1
Output Voltage: 10 Vpk
Signal Generation,
DAC:
18 bit
DC - 20 kHz (any wave form)
3µs full scale (includes settling time)
Minimum pulse duration: <h;15µs for burst; 30µs for continuous
Sine:
14 bit,
DC - 1 MHz,
400 Msps
0.01 Hz or better frequency resolution
0.002 degree phase granularity
Amplitude: 76 µV resolution
Frequency,
Stability: ±50 ppm
Accuracy: ±0.1%
Control, Status, I/O
Front Panel,
On/Off Breaker
Signal Output: BNC (analog - 10 Vp)
LED Displays: Power, System Fault, Signal-In Enabled
Back Panel,
Power Connection:
120 VAC: IEC cable with NEMA 5-15
230 VAC: IEC cable with CEE 7/7
Fuse: 2A, 250V slow blow (5 mm)
Physical Characteristics
Chassis:
The 3110A is designed for table-top or rack-mounted operation. The chassis is aluminum with a black powder-coat finish. The unit occupies two EIA 19-inch-wide units.
Weight: 9.5 lbs (4.31 kg)
Shipping Weight: 19.5 lbs (8.85 kg)
AC Power:
Single-phase, 120 VAC, 50/60 Hz, 2A service; 230 VAC, 50/60 Hz, 2A model available
Dimensions (HxWxD): 3.5 in. x 19 in. x 11.75 in. (8.9 cm x 48.3 cm x 29.8 cm )
Technical Highlights - Software
Waveforms Supported:
Sine, Ripple, DC, Triangle, Square, Rectangle, Sawtooth
Waveform Modifiers:
Amplitude, frequency and DC offset (fixed or linear, logarithmic* or exponential sweep); phase angle; duration; clipped amplitude; and ripple on AC
Waveform Controls:
Trigger (user, GPIO, LAN), Fixed Loop, Variable Loop, Scripted Variable Loop, Template Playback, GPIO Output, LAN Output
Test Capabilities,
Minimum Waveform Duration: 50 µs
Maximum Number of Loop Repeats: >1 million
Storage Capabilities, Number of Tests: 300,000 (expandable to 1 million)
See Capabilities sheet for loop characteristics.
*Logarithmic sweep available for sine, ripple and DC offset waveforms only.
Standards Library
Standards Included in the 3110 Library
Generic Standards
ANSI ASAE EP455 (Feb03)
CR 600 "Chattering Relay"
IEC 6100-4-16 (2015)
IEC 6100-4-19
ISO 7637-2 (2004)
ISO 7637-2 (2011)
ISO 11452-10
ISO 16750-2 (2012-11)
ISO 16750-2 (2023)
ISO 21498-2
ISO 21780
ISO 21848
JASO D 001-94 (1994-03-31)
SAE J1113-2 (JUL2004)
SAE J1113-11 (JUN2007)
SAE J1113-11-202303 (MAR2023)
SAE J2139 (SEP2005)
SAE J2139-201412 (DEC2014)
SAE J2628 (JUL2007)
SAE J2628-201806 (JUN2018)
NOTE: Some included tests may require voltages above 100V. Voltages above 100V are not supported by the DSR models.
Manufacturer-Specific Standards
Airbus ABD0100.1.8 Issue E
Airbus ABD0100.1.8.1 Issue C
Audi I EE-32 (2006-06)
BMW GS 95003-2 (2010-01)
BMV GS 95023
BMW GS 95024-2-1 (2010-01)
BMW GS 95024-2-2 (2011-01)
Boeing-D6-16050-5-C
Boeing-D6-36440E
Case New Holland ENS0310 (12-2-2010)
Chrysler CS-11809 (2009-05-29)
Chrysler CS-11979 (2010-04-13)
Claas CN 05 0215 (2004-12)
Cummins 14269 (06201-028)
Cummins 14387 (102020-119)
DAF BSL-003 (1998-12)
DAF BSL-006 (2009-04)
Daimler Chrysler DC-10842 (2003-12)
Daimler Chrysler PF-9326 Change D
DO160G Section 16
DO160G Section 18
DO160G Section 19
Fiat 9-90110 Issue 13 (2007-03)
Ford CS-2009.1 (2-11-2010)
Ford FMC 1278
Ford FMC 1278 Ed. 5
General Motors GMW3172_H (July 2010)
General Motors GMW3172_I
Harley-Davidson EG-812-22613
Honda 30AA
Honda 7794Z-SAAA-000 (28.12.2004)
Hyundai ES 39110-00 (2005-08)
Hyundai ES 95400-10 (2007-11-14)
Hyundai ES 96100-02 (2006-11-16)
JLR-EMC-CS v1 Amendment 4 (Nov 2013)
MBN-LV 123
MBN-LV 124
MBN-LV 148
Mazda MES PW67600 (1995-07)
MIL STD 461G
MIL STD 704F
MIL STD 1275E
Mitsubishi ES-X82010 Rev Q (2007-01)
Mitsubishi ES-X82115 Rev C
Nissan 28400NDS02 Rev 3 (1999-07)
Nissan 28400NDS03 Rev 3 (2005-08)
Nissan 28401NDS02 Rev 4 (2008-08)
Stellantis CS.00244
Stellantis CS.00245
Stellantis CS.00246
Tesla TS-0000425-05 Rev 6
Tesla TS-2024048 Rev 1
Toyota TSC70212G (2007-06)
Volkswagen VW 80000 (2009-10)
Volkswagen VW 80000 (2013-06)
Volkswagen VW 80101 (2009-03)
Volkswagen VW 8300
Volkswagen VW TL 820 66
How to Build a Test
Tests are created by combining wave segments together with other wave segments and/or control segments.
WAVE SEGMENTS (including sine, ripple, square, triangle, sawtooth, and DC offset) are the basic building blocks of each test.
The frequency, amplitude, and DC offset of each wave segment can be easily adjusted using the Wave Properties window and defined as fixed or linear, logarithmic or exponential sweep, with wave segment durations as short as 50 μs.
CONTROL SEGMENTS like Fixed Loop, Variable Loop,and Trigger make the 3110A able to reproduce very complex standards. The test shown below highlights several key abilities made possible by these control segments.
A multi-step waveform can start at one level/ condition, then be repeated, with up to four variables changing during the wave segment duration. Single or multi-step waveforms can be made to repeat (or loop) and these repeating waveforms can be nested within a larger simple or repeating waveform.
At any point during a waveform sequence, the program can be automatically paused (either holding the previous condition or muting) and wait for an external trigger before resuming.
THE RESULT is a complex waveform sequence that takes only minutes to setup, saving hours in both training and programming time compared to alternative EMC test generators.
Front & Back
Downloads
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